InAs nanowire formation on InP001
Atomic force microscopy images show that nanowires are formed for deposition in the temperature range of 400480 degrees C, a [J. Appl. Phys. 100, 114305 (2006)] published Tue Dec 5, 2006
Exploring the nanoworld with atomic force microscopy
Over its 20-year history, the atomic force microscope has gradually evolved into an instrument whose spatial resolution is now fine enough to image subatomic features on the scale of picometers
Taste - What is it?
Samples from my last immersion: physicists at the University of Nottingham, England, probe the surface of caramel with an atomic-force microscope to understand the molecular nature of its stickiness. A laser-scanning microscope at the
Atomic Force Microscopy Of Soft Or Fragile Materia
TappingMode imaging is a key advance in atomic force microscopy (AFM) of soft, adhesive or fragile samples. This patented technique allows high resolution topographic imaging of sample surfaces that are easily damaged, loosely held to
Breaking bonds in the atomic force microscope: Theory and analysis
A theoretical framework is developed to analyze molecular bond breaking in dynamic force spectroscopy using atomic force microscopy. An analytic expression of the observed bond breaking probability as a function of force is obtained in
Atomic force microscope with probe with improved tip movement
An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end
Atomic force microscopy, scanning nearfield optical microscopy and
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp. Berlin : Springer-Verlag, 2006
Atomic force microscope tests explosives
Researchers at Georgia Institute of Technology and Texas Tech University, both in the US, have used an atomic force microscope (AFM) to analyse the nanoscale thermal properties of pentaerythritol tetranitrate (PETN), an explosive
Systematic variations in apparent topographic height as measured
The contact potential difference between the tip and the two well-defined regions of similar material is utilized to examine the effects and interplay of essential tip-sample forces in atomic force microscopy. Measurements
Scanning Probe Microscopy
This lead to the modification and subsequent invention of the Atomic Force Microscope (AFM). Since then there have been various different detection parameters and probing hybrids invented. The AFM is similar to STM in all respects,
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