Guide of DESIGN FOR TEST
Cool Text: Logo and Graphics Generator
Image creation package that allows choice of objects, colors, and lighting.
Design Automation and Test in Europe (DATE)
Europe's largest electronic design forum for EDA tools, ASICs/FPGAs, IP, verification
and test technology.
The European Event for Electronic System Design & Test
Test Design
Discussion of the question of how "difficult" should a test be?
Designing a Good Test How Difficult Should a Test Be? There are many many issues in designing a good test, and a huge literature on this topic
In this section we only discuss one consideration: how "difficult" should a test be? We imagine an average class, although I don't think I have ever seen such a group of students
According to the University of Toronto marking standards, we want the mark distribution on a test to be: Mark on Test Percent of Class 0-49% (E, F) 5% 50-59% (D) 10% 60-69% (C) 35% 70-79% (B) 35% 80-100% (A) 15% In order to keep the discussion simple, we imagine a test with exactly 10 questions, and also imagine that the test is graded with no part marks awarded
We also imagine that the people who set the test managed to achieve the U of T grade distribution shown in the above table
95 percent of the class got five or more of the questions on the test correct; only five percent of the class failed the test
Further, for the students who did pass the test, each question on the test was worth one entire letter grade
I will argue that this test is not well-designed
This seems to be a waste of most students' time and a waste of the the available "test space." Also, for the vast majority of students who passed the test, any mistake on a single question costs them an entire letter grade
Bridge Designer
This free program allows you to design a virtual truss, and then put a load on it.
It will show you how the load is spread throughout the truss.
info: DESIGN FOR TEST

Photo by www.wam.umd.edu
Mentor Graphics :: The EDA Technology Leader
Provides software tools and consulting services for electronic design.
PCB Test - Design and Test tools for PCB controlled impedance and ...
Controlled impedance test and design, PCB test software. Automatic PCB testing
software and hardware.
JTAG, Boundary Scan (IEEE 1149.1), JTAG Test Solutions, JTAG Emulation
Provides information about IEEE std 1149.1 boundary-scan (JTAG) testing and
in-system programming (ISP) tools.
ASSET and Firecron will demonstrate SJTAG at the upcoming European Board Test Workshop, May 24-25
Improve test coverage, lower test costs and accelerate time-to-market by validating JTAG Design for Test
ScanWorks integration extended to new Agilent i5000 ICT The full integration of the ScanWorks JTAG test environment into Agilent Technologies' new, next-generation in-circuit test (ICT) system, the Medalist i5000, extends the more than three-year strategic relationship between ASSET and Agilent
Now, ScanWorks tests can be re-used on Agilent's complete Medalist series, including all of the 3070 and the i5000 systems
Easy yet powerful JTAG tests generated on a ScanWorks station to validate a design in development can be re-used in high-volume manufacturing and later in field service and repair operations
Cost savings and increased productivity by not developing new tests for each phase in a product's lifecycle can be huge
ASSET, an international leader in boundary-scan (IEEE 1149.1/JTAG) test and in-system programming (ISP), will host and support the web site on an ongoing basis
ASSET and Firecron demonstrate system-level JTAG proof-of-concept May 16, 2006 – ASSET InterTech Inc., an international leader in boundary-scan (IEEE 1149.1/JTAG) test and in-system programming (ISP), and will demonstrate System-level JTAG (SJTAG) test and programming in a proof-of-concept system at the upcoming European Board Test Workshop, to be held in Chilworth, Southampton, UK on May 24-25
Enterprise Developer : Everything related to Enterprise ...
Training and certification for internet software development.
Benefits

Photo by www.wipro.com
HTML.it Portale italiano dedicato al mondo delle Cgi e alle tecnologie legate ai Web Server.
Offre novità, tutorial, Faq e raccolte di script.
W3C HTML Home Page Full information on HTML and links to all the specifications.
Please send comments to www-html-testsuite@w3.org (archive )
Web Content Accessibility Guidelines 1.0
Recommendation from the W3C, which explains to developers and authors how to make
Web content accessible to people with disabilities.
[] [] Web Content Accessibility Guidelines 1.0 W3C Recommendation 5-May-1999 This version: (, ) Latest version: Previous version: Editors: Wendy Chisholm, University of Wisconsin -- Madison Gregg Vanderheiden, University of Wisconsin -- Madison Ian Jacobs, Copyright © 1999 (, ), All Rights Reserved
The Techniques Document also includes techniques for document validation and testing, and an index of HTML elements and attributes (and which techniques use them)
Textpattern
A flexible, elegant, easy-to-use content management system for all kinds of
websites, even weblogs.
DESIGN FOR TEST ?
testdriven.com: Your test-driven development community - News
The practice of Test-Driven development is an integral part of Agile processes.
This portal provides regular updates, downloads in the field.
Test your web design in different browsers - Browsershots
Generates screenshots of how websites appear at 800x600 and 1024x768 resolution
in six commonly used web browsers.
Test your web design in different browsers Paste your web address here, starting with http:// What is this? Browsershots is a free online platform where you can test your web design in different browsers
Politecnico di Milano - Facoltà del design
Campus Bovisa.
Galleria Vittorio Emanuele Simulazione semplificata del test solo per le Facoltà di Architettura
Per le Facoltà di Ingegneria del Politecnico, il test si svolgerà il 4 settembre 06 Corso gratuito di preparazione al test
International car design contest
eris : design
Free linkware templates for Diaryland, Diary-x, Blogger, Movabletype, and Wordpress.
Wireless Design Articles, Product Summaries, And Application Notes ...
Online edition of US print magazine Wireless Systems Design. Technical articles
and product news relating to wireless communications design.
PART FINDER brought to you by: QUICK POLL Do viruses pose a threat to cell phones and other mobile devices? Yes, it's a major problem They are just an emerging threat No, not a threat Not sure | RESOURCES Marketplace This extensive, 36-page guide covers all aspects of PCI Express testing
Keithley's line of RF test instruments includes the Model 2910 RF Vector Signal Generator, Model 2810 RF Vector Signal Analyzer, and Model 3500 Portable RF Power Meter
These products are compact, easy to use, and save customers time, money and effort - Design engineers â You could win $6, 000 or more in our Wireless Design Contest! Using our WiPort⢠wireless Device Server⢠- wirelessly enable your product and you could be part of the nearly $20, 000 in prizes! Need more performance and flexibility for your next application? Our AVR microcontrollers are here to help! Click here to receive the AVR reference guide
Join Tektronix for a FREE, 8-city seminar series focused on solutions for high-speed serial data testing and troubleshooting digital RF designs
Adobe - Flash Developer Center : Testing/Usability Articles
Usability tips, examples, test case, quotes, related articles and a Flash forum
for site developers.
Welcome, Guest Industries Solutions By User By Resource Search / / / Flash Developer Center Testing/Usability Learn what is involved in creating complex user interfaces for data visualization in Flash
Efficient testing guarantees that your Macromedia Flash applications work for your audience
Get a foolproof test plan in place
Downloads Product Developer Centers Topic Centers Get books with the latest information on Macromedia products
International Test Conference
Conference dedicated to electronic test technology, covering the complete cycle
from design verification to failure analysis. Includes programme and speaker ...
International Test Conference 2006 International Test Conference (ITC) 2006 will be held in Santa Clara, CA from October 24 - 26, 2006
ITC to address expanding test role Program chair Anne Gattiker spoke with Test & Measurement World chief editor Rick Nelson about 'Getting More out of Test'--the theme of this year's International Test Conference
Gattiker, research staff member at the IBM Austin Research Lab, said attendees will study delay test, compression, defect-based test, analog/mixed signal test, diagnosis, test-data collection, test power, board and system test, and other topics that will help them deal with increasing complexity and process variability
International Test Conference is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement
At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers
Usability.gov
Provided by the National Cancer Institute. Includes information and resources on
making web sites and other user interfaces more useful, usable, and accessible.
| Step-by-Step Usability Guide Plan Analyze Design Test & Refine Think About the Process Develop a Plan Assemble a Project Team And more..
Conduct Usability Testing Analyze Results Prepare Test Report And more..
Usability Test Reports Online Surveys Usability Testing Forms And more..
Card Sorting Personas Task Analysis Usability Testing And more..
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